Joint TC1 - TC2 International Symposium on Photonics and Education in Measurement Science

Updated: Jan 22, 2020


During September 17 and September 19, 2019 the Joint TC1 - TC2 International Symposium on Photonics and Education in Measurement Science in collaboration with the Conference on Optical Fibre & Photonic Sensors for Industrial & Safety Applications (OFSIS) took place in Jena, Germany. The conference was held in the Technologie- und Innovationspark Jena GmbH on the Beutenberg Campus.

The conference consisted the following scientific and industrial related topics:

  • Education & Training in Measurement & Instrumentation

  • Applied Photonics for Science & Engineering in Industry, Biology, Medicine & Environment

  • Sensor & System Characterization in Photonics & Machine Vision

  • Photonics & Machine Vision Sensors and Systems for Multimodal Sensing

  • Photonics & Machine Vision in UV, VIS/NIR, SWIR Wavelength Range and also LWIR & THz

  • Software & Processing of Multivariate & Multidimensional Data as well as Deep Learning

  • Development of Models, Methods & Algorithms in Photonics and Machine Vision

Please use the following links to get access to presentations, pictures and videos provided by the SpectroNet Collaboration Cluster Academy and SPIE Digital Library:

Initiated by the technical committees TC1 Education and Training in Measurement and Instrumentation and TC2 Photonics of IMEKO International Measurement Confederation and organized by the Group for Quality Assurance and Industrial Image Processing of the Technische Universität Ilmenau the conference was a big success and provided innovative contributions about photonics and education in measurement science from scientists and industrial experts (Figure 1).