Following up on our SpectroNet Collaboration Conference 2021, the Conference on Optical Characterization of Materials took place from 17th to 18. March 2021. The conference has been organized by the Karlsruhe Center for Spectral Signatures of Materials (KCM), an association of institutes of the Karlsruhe Institute of Technology KIT and the business unit Automated Visual Inspection of the Fraunhofer IOSB.
This year's conference, the fifth of its series, started with a Keynote-Speech from Prof. Dr. Ullrich Pfeiffer about Terahertz Imaging and Sensing with Silicon Integrated Circuits. After the Keynote, the conference consisted of 7 sessions with 19 presentations in total. The agenda can be reviewed here.
In the end of the conference, a prize was awarded for the best paper. The prize went to N. Kroell, K. Johnen, X. Chen and A. Feil with the topic "Fine metal-rich waste stream characterization based on RGB data: Comparison between feature-based and deep learning classification methods".
SpectroNet took care of recording the event. The presentations of the conference can be watched here.