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Metrohms launch of 2060 XRF Process Analyzer

Our Clusterpartner Metrohm Process Analytics introduces an online XRF analyzer designed for enhancing process monitoring and optimization.

XRF, or X-ray fluorescence, is a cutting-edge technology utilized for elemental analysis in various industries. By emitting X-rays into a sample, XRF spectroscopy identifies and quantifies the elements present, offering invaluable insights into sample composition. In process monitoring, XRF analyzers provide real-time data on elemental concentrations, enabling precise control and optimization of production processes. With its non-destructive nature and rapid results, XRF technology revolutionizes quality control and efficiency in manufacturing. Metrohm Process Analytics introduces its first XRF spectrometer, specifically Energy-Dispersive X-ray Fluorescence (EDXRF), the 2060 XRF Process Analyzer – Reliable online x-ray fluorescence analysis for liquid process control.

Reagent-less and nondestructive analysis

The 2060 XRF Process Analyzer is the latest process analyzer from Metrohm Process Analytics, designed to be able to analyze a wide range of elements from magnesium to uranium in liquid samples (z=12 to 92). By being a non-contact technique, it not only minimizes the risk of sample contamination but also reduces waste effectively by not using reagents for XRF analysis.

Powerful on the inside

To optimize XRF analysis, use the 2060 XRF Process Analyzer with advanced software solutions designed for Process Analytical Technology (PAT). This analyzer features two key software products: IMPACT and VantaTM. IMPACT serves as the user interface, enabling smart programming, result display, and communication with the plant control room. On the other hand, VantaTM manages all data analysis. Together, these software components make the 2060 XRF Process Analyzer an ideal tool for process monitoring support, providing maximum benefits for your analytical processes.

Parallel analysis using one analyzer

The 2060 XRF Process Analyzer ensures continuous data collection, operating seamlessly 24/7. Its advanced programming capabilities enhance plant safety by introducing unique features. Through intelligent conditional actions, the analyzer proactively monitors critical parameters, enabling users to make informed decisions in real-time. If a sample deviates from set limits, the analyzer reacts promptly by adjusting analysis frequency or triggers additional tests like titration, photometry, or standard addition for a thorough analysis.

The 2060 XRF Process Analyzer by Metrohm Process Analytics stands out as the optimal selection among Energy Dispersive X-ray Fluorescence (EDXRF) spectrometers. Its design focuses on quality and process control, with consideration for multiple sample points and user-friendly operation.

  • Up to 10 sampling streams possible for online XRF analysis

  • Fast analysis – Results in less than 60 seconds

  • Non-destructive analysis from magnesium to uranium in liquid samples (z=12 to 92)

  • Multiple analysis techniques in one platform (XRF with titration, photometry)

Simple, non-invasive XRF analyzer

X-ray fluorescence is a method to analyze elements in various sample matrices without damaging them, revealing what elements they contain.

But, how does XRF work? When the sample is exposed to high-energy X-rays, it causes the inner electrons of the atoms to move, creating temporary gaps. These unstable atoms quickly fill these voids by capturing outer electrons.

During this process, the excess energy is emitted as fluorescent X-rays with characteristic energy levels unique to each element present in the sample. The 2060 XRF Process Analyzer captures these emitted X-rays and determines the concentration of the specific elements of interest in the sample.

Designed for ease of use, even for those new to the technology, the 2060 XRF Process Analyzer ensures efficient operation and reliable results. By employing our process XRF analyzer, you gain access to accurate compositional data without altering or damaging your materials.

Fig 1.: The non-invasive XRF analyzer from Metrohm (Copyright Metrohm, 2024)

Achieving optimal performance with a single instrument

The 2060 XRF Process Analyzer integrates a high-resolution silicon drift detector (SDD) and proven Axon™ Technology. With its special ultra-low-noise electronics, this technology boosts X-ray counts per second (cps), leading to faster and more precise results.

Fig. 2: Achieving optimal performance with a single instrument (Copyright Metrohm, 2024)

For more information visit our Clusterpartner website.

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